Active Cantilever Scanning Microscopy
The atomic force microscope (AFM) is capable of imaging local material properties such as topology, friction, electrostatic interaction, electrical conductivity, magnetism, etc.
Active Cantilever Scanning Microscopy
Modular system components include damping, environmental chamber, positioning stage
SmartActiveProbe (cantilever) with active thermomechanical actuation for atomic resolution
Fastest SPM system in vacuum, air, and liquid
Cantilever head for fast plug-and-play cantilever exchange
Scanner and probe can be easily adapted to customer’s requirements
