STV-8M-IR

Introducing High resolution and low distortion SWIR lens SWIR (Short Wave Infrared) band covers from 900nm – 1700nm having compatible wavelength with InGaAs camera. The combination of InGaAs camera and SWIR lens enables the user to inspect sub-surface images such as MEMS devices, and photovoltaics and the apple’s moisture detected is darker. Applications: Sub-surface inspection (3D stack, wafers) Solar cell inspection Surveillance Quality control And More
Resolution: 3MP Image Format: 1″ Focal Length: 8mm F-number: F1.4 Relative Aperture: F=1:1.4 Iris Range: 1.4 to 22 Angle Field of View: 79.7°(H) x 62.9°(V) Objective wave length: 900 to 1,900nm TV Distortion(@Far): -0.1% M.O.D.: 0.12m(@900nm), 0.38m(@1,700nm) Back Focal Length: 11.1mm Flange Back: 17.526mm Operation: Focus: Manual / Iris: Manual Mount: C Filter Size: M55 P=0.75 Dimensions: Φ57 x 60.3mm (max.) Weight: 201g Operating Temperature: -10 to +50℃
Introducing High resolution and low distortion SWIR lens SWIR (Short Wave Infrared) band covers from 900nm – 1700nm having compatible wavelength with InGaAs camera. The combination of InGaAs camera and SWIR lens enables the user to inspect sub-surface images such as MEMS devices, and photovoltaics and the apple’s moisture detected is darker. Applications: Sub-surface inspection (3D stack, wafers) Solar cell inspection Surveillance Quality control And More
Resolution: 3MP Image Format: 1″ Focal Length: 8mm F-number: F1.4 Relative Aperture: F=1:1.4 Iris Range: 1.4 to 22 Angle Field of View: 79.7°(H) x 62.9°(V) Objective wave length: 900 to 1,900nm TV Distortion(@Far): -0.1% M.O.D.: 0.12m(@900nm), 0.38m(@1,700nm) Back Focal Length: 11.1mm Flange Back: 17.526mm Operation: Focus: Manual / Iris: Manual Mount: C Filter Size: M55 P=0.75 Dimensions: Φ57 x 60.3mm (max.) Weight: 201g Operating Temperature: -10 to +50℃