Introducing High resolution and low distortion SWIR lens
SWIR (Short Wave Infrared) band covers from 900nm – 1700nm having compatible wavelength with InGaAs camera. The combination of InGaAs camera and SWIR lens enables the user to inspect sub-surface images such as MEMS devices, and photovoltaics and the apple’s moisture detected is darker.
Applications:
Sub-surface inspection (3D stack, wafers)
Solar cell inspection
Surveillance
Quality control
And More
Resolution:
3MP
Image Format:
1″
Focal Length:
8mm
F-number:
F1.4
Relative Aperture:
F=1:1.4
Iris Range:
1.4 to 22
Angle Field of View:
79.7°(H) x 62.9°(V)
Objective wave length:
900 to 1,900nm
TV Distortion(@Far):
-0.1%
M.O.D.:
0.12m(@900nm), 0.38m(@1,700nm)
Back Focal Length:
11.1mm
Flange Back:
17.526mm
Operation:
Focus: Manual / Iris: Manual
Mount:
C
Filter Size:
M55 P=0.75
Dimensions:
Φ57 x 60.3mm (max.)
Weight:
201g
Operating Temperature:
-10 to +50℃