PE IR PLAN SERIES

High-resolution objectives for near infrared wavelengths up to 1600nm. Applications include laser marking, laser cutting and photo emission detection. LCD and Silicon thickness corrected versions available.

PEIR-Plan-1x

Color corrected between 800nm – 1600nm with high transmission in this range
Commonly used for laser marking and cutting and in photo emission applications
LCD and Silicon substrate thickness corrected versions available.

Technical Specifications

Image Circle (mm):
24
Magnification:
1x
Working Distance:
12
Focal Length (mm):
200
N.A.:
0.03
RP (μm):
22.4
DOF (μm):
611
Weight (g):
420

PE IR PLAN SERIES

PEIR-Plan-1x

Technical Specifications

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