PEIR-Plan-100x

High-resolution objectives for near infrared wavelengths up to 1600nm. Applications include laser marking, laser cutting and photo emission detection. LCD and Silicon thickness corrected versions available.

Image Circle (mm):
24
Magnification:
100x
Working Distance:
9.5
Focal Length (mm):
2
N.A.:
0.71
RP (μm):
0.9
DOF (μm):
0.9
Weight (g):
560

High-resolution objectives for near infrared wavelengths up to 1600nm. Applications include laser marking, laser cutting and photo emission detection. LCD and Silicon thickness corrected versions available.

Image Circle (mm):
24
Magnification:
100x
Working Distance:
9.5
Focal Length (mm):
2
N.A.:
0.71
RP (μm):
0.9
DOF (μm):
0.9
Weight (g):
560

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