IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS devices, 3D stacks, incoming wafers, and photovoltaic and wafer level CSPs with astonishing precision; while offering many capabilities and flexibility not available with traditional microscopes. The IR-2200 system integrates the infrared tabletop microscope system with software and a 4.1 Megapixel USB-3.0 NIR Camera. This system provides all necessary features for high-precision measurements, image capture, verification, and inspection of materials transparent to the near-infrared (NIR) / Shortwave Infrared (SWIR) wavelengths. Compatible objective lenses include Seiwa M. Plan APO and PE IR Plan series.